Durgamadhab Misra

Professor and Chair, Electrical and Computer Engineering, Electrical and Computer Engineering

339 Electrical and Computer Engineering Center (ECEC)

About Me

Durga Misra has been a faculty member at New Jersey Institute of Technology since 1988 after receiving his Ph.D. in Electrical Engineering from University of Waterloo, Canada. He is currently a Full Professor and the Department Chair in Electrical and Computer Engineering Department. He served as the Director of Microelectronics Research Center at NJIT (1996) and was a visiting professor at Bell Laboratories, at Murray Hill, NJ (1997). His research interests are in the areas of nanoelectronic/optoelectronic devices and circuits especially high-k gate dielectrics for low power nanoscale CMOS devices and hardware for artificial intelligence.

He edited and co-edited more than 50 books in his field of research and received several research grants from NSF, NASA and Industry. He has published more than 250 technical articles in peer reviewed Journals and in International Conference proceedings including 100 Invited Talks. He has graduated 19 PhD students and more than 50 MS students. He is a Fellow of IEEE and a Fellow of The Electrochemical Society (ECS) and served in the ECS Board as a Board Member (2008-10). He is a distinguished lecturer of IEEE Electron Device Society.

Education

Ph.D.; University of Waterloo; ; 1988

M.A.; University of Waterloo; ; 1985

M.Tech.; Indian Institute of Technology, New Delhi; ; 1983

M.S.; Utkal University; ; 1981

B.S.; Utkal University; ; 1978

Awards & Honors

2020 Fellow of IEEE, IEEE (Institute of Electrical and Electronics Engineers)

2013 Electronic and Photonic Division Award, Electronic and Photonic Division of the Electrochemical Society (ECS)

2013 Thomas D. Callinan Award, Dielectric Science and Technology Division of the Electrochemical Society (ECS)

2006 Fellow, The Electrochemical Society

Website

http://web.njit.edu/~dmisra

2024 Fall Courses

ECE 417 - ELECT AND COMP ENGR PROJ II

ECE 701B - MASTER'S THESIS

ECE 790A - DOCTRL DISSRTN & RESEARCH

ECE 700B - MASTER'S PROJECT

ECE 658 - VLSI DESIGN I

ECE 725 - INDEPENDENT STUDY I

ECE 792B - PRE-DOCTORAL RESEARCH

Teaching Interests

VLSI Design, Device Physics, Introductory ECE lab

Past Courses

ECE 291: ELECT ENGR LAB I

ECE 475: VLSI SEMICONDUCTOR CIRCU

ECE 479: OPTOELECTRONICS &ELECTRONICS LA

ECE 658: VLSI DESIGN I

ECE 658: VSLI DESIGN I

ECE 758: VLSI DESIGN II

ECE 791: GRADUATE SEMINAR

Research Interests

nanoelectronic/optoelectronic devices and circuits especially high-k gate dielectrics and low power nanoscale CMOS circuits.

Book

Lenka, T., & Misra, Durgamadhab, & Fu, L. (2022). Micro and Nanoelectronics Devices, Circuits and Systems. Singapore: Springer

Jagannathan, H., & Timans, P. J., & Kakushima, K., & Gusev, E., & Karim, Z., & Misra, Durgamadhab, & Obeng, Y. S., & De Gendt, S., & Roozeboom, F. (2022). Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 12. Pennington, New Jersey: ECS Transactions, The Electrochemical Society

Misra, Durgamadhab, & De Gendt, S., & Kakushima, K., & Kilgore, S. , & Kita, K. (2021). Semiconductors, Dielectrics, and Metals for Nanoelectronics 18. Pennington, New Jersey: ECS Transactions, The Electrochemical Society

Lenka, T., & Misra, Durgamadhab, & Biswas, A. (2021). Micro and Nanoelectronics Devices, Circuits and Systems. Singapore: Springer

Jagannathan, H., & Timans, P. J., & Kakushima, K., & Gusev, E., & Karim, Z., & Misra, Durgamadhab, & Obeng, Y. S., & De Gendt, S., & Roozeboom, F. (2021). Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 11. Pennington, New Jersey: ECS Transactions, The Electrochemical Society

Conference Proceeding

RRAM Devices with Plasma Treated HfO2 with Ru as Top Electrode for In-Memory Computing Hardware
ECS Transactions, October (4th Quarter/Autumn) 2021

Interface Treatment Related Defects During Ge Gate Stack Formation
ECS Transactions, May 2021

Dielectric Science on Today´s Devices
ECS Transactions, May 2020

Process Dependent Optimization of Dielectric and Metal Stacks for Multilevel Resistive Random-Access Memory
ECS Transactions, May 2020

Multilevel Resistive Switching in Hf-Based RRAM
ECS Transactions, May 2019

Journal Article

Misra, Durgamadhab, & Zhao, P., & Triyoso, Dina H., & Kaushik, V., & Tapily, K., & Clark, R. D., & Consiglio, S., & Hakamata, T., & Wajda, C. S., & Leusink, G. J. (2020). Dielectrics and Metal Stack Engineering for Multilevel Resistive Random-Access Memory. ECS Journal of Solid State Science and Technology, 9(053004), 7.

Paliwoda, P., & Chbili, Z., & Kerber, A., & Nigam, T., & Nagahiro, K., & Cimino, S. , & Toledano-Luque, M. P., & Pantisano, L., & Min, B. W., & Misra, Durgamadhab (2019). Self-heating effects on Hot carrier degradation and its impact on logic circuit reliability. IEEE Transactions on Device and Materials Reliability, 19(2), 249-254.

Nunna, Bharath Babu, & Mandal, Debdyuti, & Lee, Joo Un, & Singh, Harsimranjit, & Zhuang, Shiqiang, & Misra, Durgamadhab, & Bhuyian, Md Nasir Uddin, & Lee, Eon Soo (2019). Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfluidic biosensor. Nano convergence, 6(1), 3.

Nunna, B. B., & Mandal, D. , & Lee, J. U., & Singh, H., & Zhuang, S., & Misra, Durgamadhab, & Bhuyian, M. N., & Lee, Eon Soo (2019). Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfuidic biosensor. Nano Convergence, 6:3, 1-12.

Paliwoda, P., & Manik, P. P., & Singh, D., & Chbili, Z., & Kerber, A., & Johnson, J., & Misra, Durgamadhab (2018). Self-Heating Assessment on Bulk FinFET Devices Through Characterization and Predictive Simulation. IEEE Transactions on Device and Materials Reliability, 18(2), 133-138.

Chapter

Ding, Yiming, & Bhuyian, Yiming, & Ding, Yiming, & Ganapathi, K.L., & Bhat, Navakanta (2020). Emerging high-k dielectrics for nanometer CMOS technologies and memory devices, Ashok Srivastava and Saraju Mohanty (Eds.), The Institution of Engineering and Technology. (pp. 159-196). Stevenage Herts, SG1 2AY: The Institution of Engineering and Technology

Bhuyian, M. N., & Misra, Durgamadhab (2016). High-k Dielectrics and Device Reliability, S. P. Mohanty and A. Srivastava (Eds.), Nano-CMOS and Post-CMOS Electronics: Devices and Modelling. The Institute of Engineering and Technology (IET): Nano-CMOS and Post-CMOS Electronics: Devices and Modelling

Magazine/Trade Publication

High Dielectric Constant Materials for Nanoscale Devices and Beyond
Interface, December 2017

Importance of Dielectric Science in Today's Technology
Interface, December 2017

Educational Initiatives in the Field of Dielectric and Semiconductor Materials, Devices, and Processing
Interface, The Electrochemical Society, April (2nd Quarter/Spring) 2012

Evolution of Dielectric Science and Technology for Nanoelectronics
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012

High-k Dielectrics on High-Mobility Substrates
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012

Conference Abstract

Breakdown Characteristics of TiN/HfxZr1-xO2/Al2O3/Ge Gate Stacks
232nd ECS Meeting: Symposium: D01: Semiconductors, Dielectrics, and Metals for Nanoelectronics 15: In Memory of Samares Kar, October (4th Quarter/Autumn) 2017

Other

A Compact CMOS 3-D Magnetic Field Sensor
221st Meeting of The Electrochemical Society, Seattle, Washington, May 6 - May 10, 2012 , May 2012

Interfacial layer growth condition dependent carrier transport mechanisms in HfO2/SiO2 gate stacks
MRS Fall Meeting, Boston, MA, November 28-December 2, 2011, November 2011

Impact of Constant Voltage Stress on High-κ Gate Dielectric for RF IC Performance
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011

Investigation of Electrically Active Defects in n-CdS/p-CdTe Solar Cells
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011

Issues and Challenges of High-k Dielectrics on High-Mobility Substrates
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011

An Improved Dislocation Model of Silicon Solar Cell
Photovoltaic Materials and Manufacturing Issues II, Denver, Colorado, Oct 4-7, 2011., October (4th Quarter/Autumn) 2011