Durgamadhab Misra
Durgamadhab Misra
339 Electrical and Computer Engineering Center (ECEC)
About Me
Durga Misra has been a faculty member at New Jersey Institute of Technology since 1988 after receiving his Ph.D. in Electrical Engineering from University of Waterloo, Canada. He is currently a Full Professor and the Department Chair in Electrical and Computer Engineering Department. He served as the Director of Microelectronics Research Center at NJIT (1996) and was a visiting professor at Bell Laboratories, at Murray Hill, NJ (1997). His research interests are in the areas of nanoelectronic/optoelectronic devices and circuits especially high-k gate dielectrics for low power nanoscale CMOS devices and hardware for artificial intelligence.
He edited and co-edited more than 50 books in his field of research and received several research grants from NSF, NASA and Industry. He has published more than 250 technical articles in peer reviewed Journals and in International Conference proceedings including 100 Invited Talks. He has graduated 19 PhD students and more than 50 MS students. He is a Fellow of IEEE and a Fellow of The Electrochemical Society (ECS) and served in the ECS Board as a Board Member (2008-10). He is a distinguished lecturer of IEEE Electron Device Society.
He edited and co-edited more than 50 books in his field of research and received several research grants from NSF, NASA and Industry. He has published more than 250 technical articles in peer reviewed Journals and in International Conference proceedings including 100 Invited Talks. He has graduated 19 PhD students and more than 50 MS students. He is a Fellow of IEEE and a Fellow of The Electrochemical Society (ECS) and served in the ECS Board as a Board Member (2008-10). He is a distinguished lecturer of IEEE Electron Device Society.
Education
Ph.D.; University of Waterloo; ; 1988
M.A.; University of Waterloo; ; 1985
M.Tech.; Indian Institute of Technology, New Delhi; ; 1983
M.S.; Utkal University; ; 1981
B.S.; Utkal University; ; 1978
M.A.; University of Waterloo; ; 1985
M.Tech.; Indian Institute of Technology, New Delhi; ; 1983
M.S.; Utkal University; ; 1981
B.S.; Utkal University; ; 1978
Awards & Honors
2020 Fellow of IEEE, IEEE (Institute of Electrical and Electronics Engineers)
2013 Electronic and Photonic Division Award, Electronic and Photonic Division of the Electrochemical Society (ECS)
2013 Thomas D. Callinan Award, Dielectric Science and Technology Division of the Electrochemical Society (ECS)
2006 Fellow, The Electrochemical Society
2013 Electronic and Photonic Division Award, Electronic and Photonic Division of the Electrochemical Society (ECS)
2013 Thomas D. Callinan Award, Dielectric Science and Technology Division of the Electrochemical Society (ECS)
2006 Fellow, The Electrochemical Society
Website
Teaching Interests
VLSI Design, Device Physics, Introductory ECE lab
Past Courses
ECE 291: ELECT ENGR LAB I
ECE 475: VLSI SEMICONDUCTOR CIRCU
ECE 479: OPTOELECTRONICS &ELECTRONICS LA
ECE 658: VLSI DESIGN I
ECE 658: VSLI DESIGN I
ECE 758: VLSI DESIGN II
ECE 791: GRADUATE SEMINAR
ECE 475: VLSI SEMICONDUCTOR CIRCU
ECE 479: OPTOELECTRONICS &ELECTRONICS LA
ECE 658: VLSI DESIGN I
ECE 658: VSLI DESIGN I
ECE 758: VLSI DESIGN II
ECE 791: GRADUATE SEMINAR
Research Interests
nanoelectronic/optoelectronic devices and circuits especially high-k gate dielectrics and low power nanoscale CMOS circuits.
Book
Lenka, T., & Misra, Durgamadhab, & Fu, L. (2022). Micro and Nanoelectronics Devices, Circuits and Systems. Singapore: Springer
Jagannathan, H., & Timans, P. J., & Kakushima, K., & Gusev, E., & Karim, Z., & Misra, Durgamadhab, & Obeng, Y. S., & De Gendt, S., & Roozeboom, F. (2022). Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 12. Pennington, New Jersey: ECS Transactions, The Electrochemical Society
Misra, Durgamadhab, & De Gendt, S., & Kakushima, K., & Kilgore, S. , & Kita, K. (2021). Semiconductors, Dielectrics, and Metals for Nanoelectronics 18. Pennington, New Jersey: ECS Transactions, The Electrochemical Society
Lenka, T., & Misra, Durgamadhab, & Biswas, A. (2021). Micro and Nanoelectronics Devices, Circuits and Systems. Singapore: Springer
Jagannathan, H., & Timans, P. J., & Kakushima, K., & Gusev, E., & Karim, Z., & Misra, Durgamadhab, & Obeng, Y. S., & De Gendt, S., & Roozeboom, F. (2021). Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 11. Pennington, New Jersey: ECS Transactions, The Electrochemical Society
Jagannathan, H., & Timans, P. J., & Kakushima, K., & Gusev, E., & Karim, Z., & Misra, Durgamadhab, & Obeng, Y. S., & De Gendt, S., & Roozeboom, F. (2022). Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 12. Pennington, New Jersey: ECS Transactions, The Electrochemical Society
Misra, Durgamadhab, & De Gendt, S., & Kakushima, K., & Kilgore, S. , & Kita, K. (2021). Semiconductors, Dielectrics, and Metals for Nanoelectronics 18. Pennington, New Jersey: ECS Transactions, The Electrochemical Society
Lenka, T., & Misra, Durgamadhab, & Biswas, A. (2021). Micro and Nanoelectronics Devices, Circuits and Systems. Singapore: Springer
Jagannathan, H., & Timans, P. J., & Kakushima, K., & Gusev, E., & Karim, Z., & Misra, Durgamadhab, & Obeng, Y. S., & De Gendt, S., & Roozeboom, F. (2021). Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 11. Pennington, New Jersey: ECS Transactions, The Electrochemical Society
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Conference Proceeding
RRAM Devices with Plasma Treated HfO2 with Ru as Top Electrode for In-Memory Computing Hardware
ECS Transactions, October (4th Quarter/Autumn) 2021
Interface Treatment Related Defects During Ge Gate Stack Formation
ECS Transactions, May 2021
Dielectric Science on Today´s Devices
ECS Transactions, May 2020
Process Dependent Optimization of Dielectric and Metal Stacks for Multilevel Resistive Random-Access Memory
ECS Transactions, May 2020
Multilevel Resistive Switching in Hf-Based RRAM
ECS Transactions, May 2019
ECS Transactions, October (4th Quarter/Autumn) 2021
Interface Treatment Related Defects During Ge Gate Stack Formation
ECS Transactions, May 2021
Dielectric Science on Today´s Devices
ECS Transactions, May 2020
Process Dependent Optimization of Dielectric and Metal Stacks for Multilevel Resistive Random-Access Memory
ECS Transactions, May 2020
Multilevel Resistive Switching in Hf-Based RRAM
ECS Transactions, May 2019
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Journal Article
Misra, Durgamadhab, & Zhao, P., & Triyoso, Dina H., & Kaushik, V., & Tapily, K., & Clark, R. D., & Consiglio, S., & Hakamata, T., & Wajda, C. S., & Leusink, G. J. (2020). Dielectrics and Metal Stack Engineering for Multilevel Resistive Random-Access Memory. ECS Journal of Solid State Science and Technology, 9(053004), 7.
Paliwoda, P., & Chbili, Z., & Kerber, A., & Nigam, T., & Nagahiro, K., & Cimino, S. , & Toledano-Luque, M. P., & Pantisano, L., & Min, B. W., & Misra, Durgamadhab (2019). Self-heating effects on Hot carrier degradation and its impact on logic circuit reliability. IEEE Transactions on Device and Materials Reliability, 19(2), 249-254.
Nunna, Bharath Babu, & Mandal, Debdyuti, & Lee, Joo Un, & Singh, Harsimranjit, & Zhuang, Shiqiang, & Misra, Durgamadhab, & Bhuyian, Md Nasir Uddin, & Lee, Eon Soo (2019). Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfluidic biosensor. Nano convergence, 6(1), 3.
Nunna, B. B., & Mandal, D. , & Lee, J. U., & Singh, H., & Zhuang, S., & Misra, Durgamadhab, & Bhuyian, M. N., & Lee, Eon Soo (2019). Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfuidic biosensor. Nano Convergence, 6:3, 1-12.
Paliwoda, P., & Manik, P. P., & Singh, D., & Chbili, Z., & Kerber, A., & Johnson, J., & Misra, Durgamadhab (2018). Self-Heating Assessment on Bulk FinFET Devices Through Characterization and Predictive Simulation. IEEE Transactions on Device and Materials Reliability, 18(2), 133-138.
Paliwoda, P., & Chbili, Z., & Kerber, A., & Nigam, T., & Nagahiro, K., & Cimino, S. , & Toledano-Luque, M. P., & Pantisano, L., & Min, B. W., & Misra, Durgamadhab (2019). Self-heating effects on Hot carrier degradation and its impact on logic circuit reliability. IEEE Transactions on Device and Materials Reliability, 19(2), 249-254.
Nunna, Bharath Babu, & Mandal, Debdyuti, & Lee, Joo Un, & Singh, Harsimranjit, & Zhuang, Shiqiang, & Misra, Durgamadhab, & Bhuyian, Md Nasir Uddin, & Lee, Eon Soo (2019). Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfluidic biosensor. Nano convergence, 6(1), 3.
Nunna, B. B., & Mandal, D. , & Lee, J. U., & Singh, H., & Zhuang, S., & Misra, Durgamadhab, & Bhuyian, M. N., & Lee, Eon Soo (2019). Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfuidic biosensor. Nano Convergence, 6:3, 1-12.
Paliwoda, P., & Manik, P. P., & Singh, D., & Chbili, Z., & Kerber, A., & Johnson, J., & Misra, Durgamadhab (2018). Self-Heating Assessment on Bulk FinFET Devices Through Characterization and Predictive Simulation. IEEE Transactions on Device and Materials Reliability, 18(2), 133-138.
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Chapter
Ding, Yiming, & Bhuyian, Yiming, & Ding, Yiming, & Ganapathi, K.L., & Bhat, Navakanta (2020). Emerging high-k dielectrics for nanometer CMOS technologies and memory devices, Ashok Srivastava and Saraju Mohanty (Eds.), The Institution of Engineering and Technology. (pp. 159-196). Stevenage Herts, SG1 2AY: The Institution of Engineering and Technology
Bhuyian, M. N., & Misra, Durgamadhab (2016). High-k Dielectrics and Device Reliability, S. P. Mohanty and A. Srivastava (Eds.), Nano-CMOS and Post-CMOS Electronics: Devices and Modelling. The Institute of Engineering and Technology (IET): Nano-CMOS and Post-CMOS Electronics: Devices and Modelling
Bhuyian, M. N., & Misra, Durgamadhab (2016). High-k Dielectrics and Device Reliability, S. P. Mohanty and A. Srivastava (Eds.), Nano-CMOS and Post-CMOS Electronics: Devices and Modelling. The Institute of Engineering and Technology (IET): Nano-CMOS and Post-CMOS Electronics: Devices and Modelling
Magazine/Trade Publication
High Dielectric Constant Materials for Nanoscale Devices and Beyond
Interface, December 2017
Importance of Dielectric Science in Today's Technology
Interface, December 2017
Educational Initiatives in the Field of Dielectric and Semiconductor Materials, Devices, and Processing
Interface, The Electrochemical Society, April (2nd Quarter/Spring) 2012
Evolution of Dielectric Science and Technology for Nanoelectronics
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012
High-k Dielectrics on High-Mobility Substrates
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012
Interface, December 2017
Importance of Dielectric Science in Today's Technology
Interface, December 2017
Educational Initiatives in the Field of Dielectric and Semiconductor Materials, Devices, and Processing
Interface, The Electrochemical Society, April (2nd Quarter/Spring) 2012
Evolution of Dielectric Science and Technology for Nanoelectronics
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012
High-k Dielectrics on High-Mobility Substrates
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012
Conference Abstract
Breakdown Characteristics of TiN/HfxZr1-xO2/Al2O3/Ge Gate Stacks
232nd ECS Meeting: Symposium: D01: Semiconductors, Dielectrics, and Metals for Nanoelectronics 15: In Memory of Samares Kar, October (4th Quarter/Autumn) 2017
232nd ECS Meeting: Symposium: D01: Semiconductors, Dielectrics, and Metals for Nanoelectronics 15: In Memory of Samares Kar, October (4th Quarter/Autumn) 2017
Other
A Compact CMOS 3-D Magnetic Field Sensor
221st Meeting of The Electrochemical Society, Seattle, Washington, May 6 - May 10, 2012 , May 2012
Interfacial layer growth condition dependent carrier transport mechanisms in HfO2/SiO2 gate stacks
MRS Fall Meeting, Boston, MA, November 28-December 2, 2011, November 2011
Impact of Constant Voltage Stress on High-κ Gate Dielectric for RF IC Performance
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011
Investigation of Electrically Active Defects in n-CdS/p-CdTe Solar Cells
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011
Issues and Challenges of High-k Dielectrics on High-Mobility Substrates
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011
An Improved Dislocation Model of Silicon Solar Cell
Photovoltaic Materials and Manufacturing Issues II, Denver, Colorado, Oct 4-7, 2011., October (4th Quarter/Autumn) 2011
221st Meeting of The Electrochemical Society, Seattle, Washington, May 6 - May 10, 2012 , May 2012
Interfacial layer growth condition dependent carrier transport mechanisms in HfO2/SiO2 gate stacks
MRS Fall Meeting, Boston, MA, November 28-December 2, 2011, November 2011
Impact of Constant Voltage Stress on High-κ Gate Dielectric for RF IC Performance
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011
Investigation of Electrically Active Defects in n-CdS/p-CdTe Solar Cells
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011
Issues and Challenges of High-k Dielectrics on High-Mobility Substrates
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011
An Improved Dislocation Model of Silicon Solar Cell
Photovoltaic Materials and Manufacturing Issues II, Denver, Colorado, Oct 4-7, 2011., October (4th Quarter/Autumn) 2011