Durgamadhab Misra
Durgamadhab Misra
Professor and Chair, Electrical and Computer Engineering, Electrical and Computer Engineering
339 Electrical and Computer Engineering Center (ECEC)
About Me
Durga Misra has been a faculty member at New Jersey Institute of Technology since 1988 after receiving his Ph.D. in Electrical Engineering from University of Waterloo, Canada. He is currently a Full Professor and the Department Chair in Electrical and Computer Engineering Department. He served as the Director of Microelectronics Research Center at NJIT (1996) and was a visiting professor at Bell Laboratories, at Murray Hill, NJ (1997). His research interests are in the areas of nanoelectronic/optoelectronic devices and circuits especially high-k gate dielectrics for low power nanoscale CMOS devices and hardware for artificial intelligence.
He edited and co-edited more than 50 books in his field of research and received several research grants from NSF, NASA and Industry. He has published more than 250 technical articles in peer reviewed Journals and in International Conference proceedings including 100 Invited Talks. He has graduated 19 PhD students and more than 50 MS students. He is a Fellow of IEEE and a Fellow of The Electrochemical Society (ECS) and served in the ECS Board as a Board Member (2008-10). He is a distinguished lecturer of IEEE Electron Device Society.
He edited and co-edited more than 50 books in his field of research and received several research grants from NSF, NASA and Industry. He has published more than 250 technical articles in peer reviewed Journals and in International Conference proceedings including 100 Invited Talks. He has graduated 19 PhD students and more than 50 MS students. He is a Fellow of IEEE and a Fellow of The Electrochemical Society (ECS) and served in the ECS Board as a Board Member (2008-10). He is a distinguished lecturer of IEEE Electron Device Society.
Education
Ph.D.; University of Waterloo; ; 1988
M.A.; University of Waterloo; ; 1985
M.Tech.; Indian Institute of Technology, New Delhi; ; 1983
M.S.; Utkal University; ; 1981
B.S.; Utkal University; ; 1978
M.A.; University of Waterloo; ; 1985
M.Tech.; Indian Institute of Technology, New Delhi; ; 1983
M.S.; Utkal University; ; 1981
B.S.; Utkal University; ; 1978
Awards & Honors
2020 Fellow of IEEE, IEEE (Institute of Electrical and Electronics Engineers)
2013 Electronic and Photonic Division Award, Electronic and Photonic Division of the Electrochemical Society (ECS)
2013 Thomas D. Callinan Award, Dielectric Science and Technology Division of the Electrochemical Society (ECS)
2006 Fellow, The Electrochemical Society
2013 Electronic and Photonic Division Award, Electronic and Photonic Division of the Electrochemical Society (ECS)
2013 Thomas D. Callinan Award, Dielectric Science and Technology Division of the Electrochemical Society (ECS)
2006 Fellow, The Electrochemical Society
Website
2025 Spring Courses
ECE 417 - ELECT AND COMP ENGR PROJ II
ECE 701B - MASTER'S THESIS
ECE 726 - INDEPENDENT STUDY II
ECE 790A - DOCTRL DISSRTN & RESEARCH
ECE 700B - MASTER'S PROJECT
ECE 701C - MASTER'S THESIS
ECE 725 - INDEPENDENT STUDY I
ECE 792B - PRE-DOCTORAL RESEARCH
ECE 701B - MASTER'S THESIS
ECE 726 - INDEPENDENT STUDY II
ECE 790A - DOCTRL DISSRTN & RESEARCH
ECE 700B - MASTER'S PROJECT
ECE 701C - MASTER'S THESIS
ECE 725 - INDEPENDENT STUDY I
ECE 792B - PRE-DOCTORAL RESEARCH
Teaching Interests
VLSI Design, Device Physics, Introductory ECE lab
Past Courses
ECE 291: ELECT ENGR LAB I
ECE 475: VLSI SEMICONDUCTOR CIRCU
ECE 479: OPTOELECTRONICS &ELECTRONICS LA
ECE 658: VLSI DESIGN I
ECE 658: VSLI DESIGN I
ECE 758: VLSI DESIGN II
ECE 791: GRADUATE SEMINAR
ECE 475: VLSI SEMICONDUCTOR CIRCU
ECE 479: OPTOELECTRONICS &ELECTRONICS LA
ECE 658: VLSI DESIGN I
ECE 658: VSLI DESIGN I
ECE 758: VLSI DESIGN II
ECE 791: GRADUATE SEMINAR
Research Interests
nanoelectronic/optoelectronic devices and circuits especially high-k gate dielectrics and low power nanoscale CMOS circuits.
Book
T. Lenka, Durgamadhab Misra, L. Fu. 2022. “Micro and Nanoelectronics Devices, Circuits and Systems.” 528 pages pp. Singapore, Singapore: Springer, 2022. ISBN ISBN: 978-981-19-2308-1.
H. Jagannathan, P. J. Timans, K. Kakushima, E. Gusev, Z. Karim, Durgamadhab Misra, Y. S. Obeng, S. De Gendt, F. Roozeboom. 2022. “Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 12.” 103 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2022. ISBN 10.1149/10805.0093ecst.
Durgamadhab Misra, S. De Gendt, K. Kakushima, S. Kilgore, K. Kita. 2021. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 18.” 71 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2021.
T. Lenka, Durgamadhab Misra, A. Biswas. 2021. “Micro and Nanoelectronics Devices, Circuits and Systems.” 511 pages pp. Singapore, Singapore: Springer, 2021. ISBN ISBN 978-981-16-3767-4.
H. Jagannathan, P. J. Timans, K. Kakushima, E. Gusev, Z. Karim, Durgamadhab Misra, Y. S. Obeng, S. De Gendt, F. Roozeboom. 2021. “Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 11.” 178 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2021. ISBN ISBN 978-1-60768-914-0.
H. Jagannathan, P. J. Timans, K. Kakushima, E. Gusev, Z. Karim, Durgamadhab Misra, Y. S. Obeng, S. De Gendt, F. Roozeboom. 2022. “Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 12.” 103 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2022. ISBN 10.1149/10805.0093ecst.
Durgamadhab Misra, S. De Gendt, K. Kakushima, S. Kilgore, K. Kita. 2021. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 18.” 71 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2021.
T. Lenka, Durgamadhab Misra, A. Biswas. 2021. “Micro and Nanoelectronics Devices, Circuits and Systems.” 511 pages pp. Singapore, Singapore: Springer, 2021. ISBN ISBN 978-981-16-3767-4.
H. Jagannathan, P. J. Timans, K. Kakushima, E. Gusev, Z. Karim, Durgamadhab Misra, Y. S. Obeng, S. De Gendt, F. Roozeboom. 2021. “Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 11.” 178 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2021. ISBN ISBN 978-1-60768-914-0.
SHOW MORE
S. Mitra, A. Kkosla, J. Koehne, P. Hesketh, S. Bhansali, Q. li, S. W. Joo, Durgamadhab Misra, X. J. Xuan, M. Pan, S. Qian, H. Baumgart, P. Vanysek, C. Xian. 2020. “Microfabricated and Nanofabricated Systems for MEMS/NEMS 15.” 75 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2020. ISBN ISBN 978-1-60768-906-5.
Durgamadhab Misra, S. De Gendt, K. Kita, K. Kakushima, P. Mascher, U. Cvelbar, F. Roozeboom, G. W. Hunter, L. J. Li, C. O'Dwyer. 2020. “Semiconductors, Dielectrics, and Metals for Nanoelectronics and Plasma Nanosciences.” 172 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2020. ISBN ISBN 978-1-60768-898-3.
Durgamadhab Misra, Z. Chen, Dong Kyun Ko, Y. Obeng, D. Bauza, T. Chikyow. 2020. “Dielectrics for Nanosystems 8: Materials Science, Processing, Reliability, and Manufacturing.” 353 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2020. ISBN ISBN 978-1-60768-889-1.
H. Jagannathan, K. Kakushima, P. J. Timans, E. Gusev, Z. Karim, S. De Gendt, Durgamadhab Misra, Y. S. Obeng, F. Roozeboom. 2020. “Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 10.” 102 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2020. ISBN ISBN 978-1-60768-891-4.
Durgamadhab Misra, S. De Gendt, S.H. Kilgore, K. Kita, S. Dayeh, K. Kakushima. 2019. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 17.” 99 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2019. ISBN ISBN 978-1-60768-875-4.
F. Roozeboom, P. J. Timans, K. Kakushima, E. Gusev, Z. Karim, Durgamadhab Misra, Y. S. Obeng, S. De Gendt, H. Jagannathan. 2019. “Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9.” 165 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2019. ISBN ISBN 978-1-60768-868-6.
Durgamadhab Misra, S. De Gendt, S. Dayeh, K. Kita. 2018. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 16.” 85 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2018. ISBN ISBN 978-1-60768-846-4.
Durgamadhab Misra, S. De Gendt, M. Houssa, K. Kita, D. Landheer. 2017. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 15 In Memory of Samares Kar.” 395 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2017. ISBN ISBN 978-1-60768-818-1.
Durgamadhab Misra, P. Hesketh, Z. Karim, S. De Gandt, Y. Obeng, P. Srinivasan. 2017. “Emerging Materials for Post CMOS Devices/Sensing and Applications 8.” 109 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2017. ISBN ISSN: 938-5862.
S. Kar, K. Kita, D. Landheer, Durgamadhab Misra. 2016. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 14.” 319 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2016. ISBN 978-1-62332-364-6.
Durgamadhab Misra, D. Bauza, Z. Chen, K.B. Sandaram, Y. Obeng, T. Chikyow, H. Iwai. 2016. “Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing.” 353 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2016. ISBN 978-1-62332-354-7.
S. Kar, K. Kita, D. Landheer, Durgamadhab Misra. 2015. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 13.” 374 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2015. ISBN 978-1-62332-312-7.
S. Kar, M. Houssa, S. VanElshocht, Durgamadhab Misra, K. Kita, D. Landheer, S. A. Dayeh. 2014. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 12.” 191 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2014. ISBN 978-1-62332-188-8.
Durgamadhab Misra, D. Bauza, Z. Chen, Y. Obeng, T. Chikyow, H. Iwai. 2014. “Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability, and Manufacturing -and- Tutorials in Nanotechnology: More than Moore - Beyond CMOS Emerging Materials and Devices.” 412 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2014. ISBN 978-1-62332-161-1 .
S. Kar, S. VanElshocht, K. Kita, Durgamadhab Misra. 2013. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 11.” 394 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2013. ISBN 978-1-62332-098-0.
Durgamadhab Misra, S. DeGendt, Y. Obeng, P. Srinivasan, Z. Karim. 2013. “Graphene, Ge/III-V, Nanowires, and Emerging Materials for Post-CMOS Applications 5.” 371 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2013. ISBN 978-1-62332-023-2.
M. J. Deen, Durgamadhab Misra, D. N. Buckley. 2013. “Integrated Optoelectronics 6.” 67 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2013. ISBN 978-1-62332-056-0 .
S. Kar, S. VanElshocht, K. Kita, Durgamadhab Misra. 2012. “Physics and Technology of High-k Materials 10.” 358 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2012. ISBN 978-1-62332-003-4.
Durgamadhab Misra, D. Bauza, Z. Chen, T. Chikyow, H. Iwai, Y. Obeng, S. Dutta. 2012. “Dielectrics for Nanosystems 5: Materials Science, Processing, Reliability, and Manufacturing -and- Tutorials in Nanotechnology: More than Moore - Beyond CMOS Emerging Materials and Devices.” 598 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2012. ISBN 978-1-56677-955-5.
Y. Obeng, S. DeGendt, Z. Karim, Durgamadhab Misra, P. Srinivasan. 2012. “Graphene, Ge/III-V, Nanowires, and Emerging Materials for Post-CMOS Applications 4.” 242 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2012. ISBN 978-1-56677-956-2.
S. Kar, M. Houssa, S. VanElshocht, Durgamadhab Misra, K. Kita. 2011. “Physics and Technology of High-k Materials 9.” 492 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2011. ISBN 978-1-56677-903-6.
K. Kondo, F. Roozeboom, R. Akolkar, M. Koyanagi, Durgamadhab Misra. 2011. “Processing Materials of 3D Interconnects, Damascene and Electronics Packaging.” 134 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2011. ISBN 978-1-56677-985-2.
K. Sundaram, Durgamadhab Misra, H. Iwai, J. Fenton. 2011. “Solid State Topics (General).” 50 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2011. ISBN 978-1-56677-974-6.
Z. Karim, Durgamadhab Misra, P. Srinivasan, Y. Obeng, S. De Gendt. 2011. “ECS Transaction on Dielectrics in Nanosystems and Graphene, Ge/III-V, Nanowires and Emerging Materials for Post-CMOS Applications-3.” 532 pp. Pennington, NJ, USA: Electrochemical Society, 2011. ISBN ISBN 978-1-56677-884-0.
K. Sundaram, Durgamadhab Misra, A. Baca. 2010. “ECS Transactions on Solid State Topics (General).” 121 pp. Pennington, NJ, USA: Electrochemical Society, 2010. ISBN ISBN 978-1-56677-889-3.
S. Kar, S. Van Elshocht, D. Landeer, Durgamadhab Misra, K. Kita. 2010. “Physics and Technology of High-K Materials - 8.” 605 pages pp. Pennington, NJ, USA: Electrochemical Society, 2010. ISBN ISBN 978-1-56677-822-0.
Durgamadhab Misra, Daniel Bauza, Zhi Chen, T Chikyow, Hiroshi Iwai, Yaw Obeng. 2010. “Dielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing.” 574 pp. Pennington, NJ, USA: The Electrochemical Society, 2010. ISBN ISBN 978-1-56677-792-6.
P Srinivasan, Zia Karim, Yaw Obeng, S De Gendt, Durgamadhab Misra. 2010. “Graphene, Ge/III-V, and Emerging Materials for Post-CMOS Applications-2.” 247 pp. Pennington, NJ, USA: The Electrochemical Society, 2010. ISBN 978-1-56677-795-7.
Durgamadhab Misra, S. De Gendt, K. Kita, K. Kakushima, P. Mascher, U. Cvelbar, F. Roozeboom, G. W. Hunter, L. J. Li, C. O'Dwyer. 2020. “Semiconductors, Dielectrics, and Metals for Nanoelectronics and Plasma Nanosciences.” 172 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2020. ISBN ISBN 978-1-60768-898-3.
Durgamadhab Misra, Z. Chen, Dong Kyun Ko, Y. Obeng, D. Bauza, T. Chikyow. 2020. “Dielectrics for Nanosystems 8: Materials Science, Processing, Reliability, and Manufacturing.” 353 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2020. ISBN ISBN 978-1-60768-889-1.
H. Jagannathan, K. Kakushima, P. J. Timans, E. Gusev, Z. Karim, S. De Gendt, Durgamadhab Misra, Y. S. Obeng, F. Roozeboom. 2020. “Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 10.” 102 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2020. ISBN ISBN 978-1-60768-891-4.
Durgamadhab Misra, S. De Gendt, S.H. Kilgore, K. Kita, S. Dayeh, K. Kakushima. 2019. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 17.” 99 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2019. ISBN ISBN 978-1-60768-875-4.
F. Roozeboom, P. J. Timans, K. Kakushima, E. Gusev, Z. Karim, Durgamadhab Misra, Y. S. Obeng, S. De Gendt, H. Jagannathan. 2019. “Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9.” 165 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2019. ISBN ISBN 978-1-60768-868-6.
Durgamadhab Misra, S. De Gendt, S. Dayeh, K. Kita. 2018. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 16.” 85 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2018. ISBN ISBN 978-1-60768-846-4.
Durgamadhab Misra, S. De Gendt, M. Houssa, K. Kita, D. Landheer. 2017. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 15 In Memory of Samares Kar.” 395 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2017. ISBN ISBN 978-1-60768-818-1.
Durgamadhab Misra, P. Hesketh, Z. Karim, S. De Gandt, Y. Obeng, P. Srinivasan. 2017. “Emerging Materials for Post CMOS Devices/Sensing and Applications 8.” 109 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2017. ISBN ISSN: 938-5862.
S. Kar, K. Kita, D. Landheer, Durgamadhab Misra. 2016. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 14.” 319 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2016. ISBN 978-1-62332-364-6.
Durgamadhab Misra, D. Bauza, Z. Chen, K.B. Sandaram, Y. Obeng, T. Chikyow, H. Iwai. 2016. “Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing.” 353 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2016. ISBN 978-1-62332-354-7.
S. Kar, K. Kita, D. Landheer, Durgamadhab Misra. 2015. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 13.” 374 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2015. ISBN 978-1-62332-312-7.
S. Kar, M. Houssa, S. VanElshocht, Durgamadhab Misra, K. Kita, D. Landheer, S. A. Dayeh. 2014. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 12.” 191 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2014. ISBN 978-1-62332-188-8.
Durgamadhab Misra, D. Bauza, Z. Chen, Y. Obeng, T. Chikyow, H. Iwai. 2014. “Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability, and Manufacturing -and- Tutorials in Nanotechnology: More than Moore - Beyond CMOS Emerging Materials and Devices.” 412 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2014. ISBN 978-1-62332-161-1 .
S. Kar, S. VanElshocht, K. Kita, Durgamadhab Misra. 2013. “Semiconductors, Dielectrics, and Metals for Nanoelectronics 11.” 394 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2013. ISBN 978-1-62332-098-0.
Durgamadhab Misra, S. DeGendt, Y. Obeng, P. Srinivasan, Z. Karim. 2013. “Graphene, Ge/III-V, Nanowires, and Emerging Materials for Post-CMOS Applications 5.” 371 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2013. ISBN 978-1-62332-023-2.
M. J. Deen, Durgamadhab Misra, D. N. Buckley. 2013. “Integrated Optoelectronics 6.” 67 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2013. ISBN 978-1-62332-056-0 .
S. Kar, S. VanElshocht, K. Kita, Durgamadhab Misra. 2012. “Physics and Technology of High-k Materials 10.” 358 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2012. ISBN 978-1-62332-003-4.
Durgamadhab Misra, D. Bauza, Z. Chen, T. Chikyow, H. Iwai, Y. Obeng, S. Dutta. 2012. “Dielectrics for Nanosystems 5: Materials Science, Processing, Reliability, and Manufacturing -and- Tutorials in Nanotechnology: More than Moore - Beyond CMOS Emerging Materials and Devices.” 598 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2012. ISBN 978-1-56677-955-5.
Y. Obeng, S. DeGendt, Z. Karim, Durgamadhab Misra, P. Srinivasan. 2012. “Graphene, Ge/III-V, Nanowires, and Emerging Materials for Post-CMOS Applications 4.” 242 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2012. ISBN 978-1-56677-956-2.
S. Kar, M. Houssa, S. VanElshocht, Durgamadhab Misra, K. Kita. 2011. “Physics and Technology of High-k Materials 9.” 492 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2011. ISBN 978-1-56677-903-6.
K. Kondo, F. Roozeboom, R. Akolkar, M. Koyanagi, Durgamadhab Misra. 2011. “Processing Materials of 3D Interconnects, Damascene and Electronics Packaging.” 134 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2011. ISBN 978-1-56677-985-2.
K. Sundaram, Durgamadhab Misra, H. Iwai, J. Fenton. 2011. “Solid State Topics (General).” 50 pages pp. Pennington, New Jersey, United States: ECS Transactions, The Electrochemical Society, 2011. ISBN 978-1-56677-974-6.
Z. Karim, Durgamadhab Misra, P. Srinivasan, Y. Obeng, S. De Gendt. 2011. “ECS Transaction on Dielectrics in Nanosystems and Graphene, Ge/III-V, Nanowires and Emerging Materials for Post-CMOS Applications-3.” 532 pp. Pennington, NJ, USA: Electrochemical Society, 2011. ISBN ISBN 978-1-56677-884-0.
K. Sundaram, Durgamadhab Misra, A. Baca. 2010. “ECS Transactions on Solid State Topics (General).” 121 pp. Pennington, NJ, USA: Electrochemical Society, 2010. ISBN ISBN 978-1-56677-889-3.
S. Kar, S. Van Elshocht, D. Landeer, Durgamadhab Misra, K. Kita. 2010. “Physics and Technology of High-K Materials - 8.” 605 pages pp. Pennington, NJ, USA: Electrochemical Society, 2010. ISBN ISBN 978-1-56677-822-0.
Durgamadhab Misra, Daniel Bauza, Zhi Chen, T Chikyow, Hiroshi Iwai, Yaw Obeng. 2010. “Dielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing.” 574 pp. Pennington, NJ, USA: The Electrochemical Society, 2010. ISBN ISBN 978-1-56677-792-6.
P Srinivasan, Zia Karim, Yaw Obeng, S De Gendt, Durgamadhab Misra. 2010. “Graphene, Ge/III-V, and Emerging Materials for Post-CMOS Applications-2.” 247 pp. Pennington, NJ, USA: The Electrochemical Society, 2010. ISBN 978-1-56677-795-7.
COLLAPSE
Conference Proceeding
“RRAM Devices with Plasma Treated HfO2 with Ru as Top Electrode for In-Memory Computing Hardware”
ECS Transactions, October (4th Quarter/Autumn) 2021.
“Interface Treatment Related Defects During Ge Gate Stack Formation”
ECS Transactions, May 2021.
“Dielectric Science on Today´s Devices”
ECS Transactions, May 2020.
“Process Dependent Optimization of Dielectric and Metal Stacks for Multilevel Resistive Random-Access Memory”
ECS Transactions, May 2020.
“Multilevel Resistive Switching in Hf-Based RRAM”
ECS Transactions, May 2019.
ECS Transactions, October (4th Quarter/Autumn) 2021.
“Interface Treatment Related Defects During Ge Gate Stack Formation”
ECS Transactions, May 2021.
“Dielectric Science on Today´s Devices”
ECS Transactions, May 2020.
“Process Dependent Optimization of Dielectric and Metal Stacks for Multilevel Resistive Random-Access Memory”
ECS Transactions, May 2020.
“Multilevel Resistive Switching in Hf-Based RRAM”
ECS Transactions, May 2019.
SHOW MORE
“The multi-platform optics and photonics educational app”
2018.
“Self-heating effects on Hot carrier degradation and its impact on Ring-Oscillator reliability”
Proceeding of IEEE International Integrated Reliability Workshop, October (4th Quarter/Autumn) 2018.
“Bilayer Dielectrics for RRAM Devices”
ECS Transactions, October (4th Quarter/Autumn) 2018.
“The Multi-Platform Optics and Photonics Educational App”
Proceedings of the ASEE Annual Conference, June 2018.
“Ambient temperature and layout impact on self-heating characterization in FinFET devices”
IEEE International Reliability Physics Symposium (IRPS), March 2018.
“Self-heating measurement methodologies and their assesment on bulk FinFET devices”
Proceeding of IEEE International Integrated Reliability Workshop, October (4th Quarter/Autumn) 2017.
“Breakdown Characteristics of TiN/HfxZr1-xO2/Al2O3/Ge Gate Stacks”
ECS Transactions, October (4th Quarter/Autumn) 2017.
“Solving the Interface Problem in Ge/High-k Gate Stacks”
International Semiconductor Conference for Global Challenge 2017, July (3rd Quarter/Summer) 2017.
“Frequency and Area Dependence of High-K/Ge MOS Capacitors”
ECS Transactions, May 2017.
“Reliability of Post Plasma Oxidation Processed ALD Al2O3/Hf1-xZrxO2 Thin Films on Ge Substrates”
ECS Transactions, May 2017.
“The Effect of Defects on Time Dependent Dielectric Breakdown Acceleration in TiN/ZrO2/Al2O3/p-Ge Gate Stacks”
ECS Transactions, May 2017.
“Reduction of Interface States in Ge/High-k Gate Stacks and Its Reliability Implications”
Proceedings of IEEE International Conference on Solid-State and Integrated Circuit Technology 2016 , October (4th Quarter/Autumn) 2016.
“Bias Temperature Instability and its correlation to flicker (1/f) noise in FinFETs”
Proceeding of IEEE International Integrated Reliability Workshop, October (4th Quarter/Autumn) 2016.
“Dry and Wet Processed Interface Layer in Ge/High-K Devices studied by Deep Level Transient Spectroscopy”
ECS Transactions, May 2016.
“Effect of Post Plasma Oxidation on Ge Gate Stacks Interface Formation”
ECS Transactions, May 2016.
“Improved dislocation model for silicon solar cells: Calculation of dark current”
Conference Record of the IEEE Photovoltaic Specialists Conference, 2015.
“Electrical Characterization of Dry and Wet Processed Interface Layer in Ge/High-K Devices”
ECS Transactions, October (4th Quarter/Autumn) 2015.
“Spatial-Sensitive Feature of DLTS and Application in CdS/CdTe Solar Cells”
31st European Photovoltaic Solar Energy Conference and Exhibition, September 2015.
“Dielectric-Semiconductor Interface for High-k Gate Dielectrics for sub-16nm CMOS Technology ”
Proceedings of IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 2015. , June 2015.
“Oxide structure-dependent interfacial layer defects of HfAlO/SiO2/Si stack analyzed by conductance method”
ECS Transactions, The Electrochemical Society, May 2015.
“Reliability of HfAlOx in Multi Layered Gate Stack”
IEEE International Reliability Physics Symposium 2015, April (2nd Quarter/Spring) 2015.
“High-k Gate Dielectrics For Sub-16nm CMOS Technology: Creating A Perfect Dielectric-Semiconductor Interface”
Proceedings of the IKAUST NSF Research Conference On Electronic Materials, Devices And Systems For A Sustainable Future 2015, February 2015.
“Effect of Al Doping on the Reliability of ALD HfO2”
ECS Transactions, October (4th Quarter/Autumn) 2014.
“Reliability Considerations of High- Dielectrics Deposited by Various Intermediate Treatment”
ECS Transactions, The Electrochemical Society, March 2014.
“Reliability of ALD Hf1-xZrxO2 Deposited by Intermediate Annealing or Intermediate Plasma Treatment”
ECS Transactions, The Electrochemical Society, October (4th Quarter/Autumn) 2013.
“(DS&T Thomas D. Callinan Award Presentation) Role of Hydrogen in Dielectrics for Electronics and Optoelectronics Devices”
ECS Transactions, The Electrochemical Society, May 2013.
“(Electronics & Photonics Division Award Presentation) Si-SiO2 Interface to High-K-Ge/III-V Interface: Passivation and Reliability”
ECS Transactions, The Electrochemical Society, May 2013.
“A 256-channel (element) correlator design based on an FPGA for X-ray Photon Correlation Spectroscopy”
IEEE Nuclear Science Symposium and Medical Imaging Conference, 2012.
“Interface Engineering of High-K and High-Mobility Substrate Interface ”
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), October (4th Quarter/Autumn) 2012.
“Investigation of defects in N+-CDS/P-CdTe solar cells”
38th IEEE Photovoltaic Specialists Conference (PVSC), June 2012.
“A Compact CMOS 3-D Magnetic Field Sensor”
ECS Transactions, The Electrochemical Society, May 2012.
“Relaxor behavior in Ba0.8Sr0.2TiO3/ZrO2 heterostructured thin films”
Mater. Res. Soc. Proc. 1454, DOI: 10.1557/opl. 2012.1254, April (2nd Quarter/Spring) 2012.
“Interfacial layer growth condition dependent electrical conduction in HfO2/SiO2 heterostructured thin films”
Mater. Res. Soc. Proc. 1397, DOI: 10.1557/opl, March 2012.
“Advancements in PV multicrystalline silicon solar cells from 1980 to 2010 - An overview”
Conference Record of the IEEE Photovoltaic Specialists Conference, 2011.
“Impact of Constant Voltage Stress on High-κ Gate Dielectric for RF IC Performance”
ECS Transactions, The Electrochemical Society, October (4th Quarter/Autumn) 2011.
“Investigation of Electrically Active Defects in n-CdS/p-CdTe Solar Cells”
ECS Transactions, The Electrochemical Society, October (4th Quarter/Autumn) 2011.
“Issues and Challenges of High-k Dielectrics on High-Mobility Substrates”
ECS Transactions, The Electrochemical Society, October (4th Quarter/Autumn) 2011.
“ZrO2 layer thickness dependent Electrical and dielectric properties of BST/ZrO2/BST multilayer thin films”
Mater. Res. Soc. Proceedings, WW – Multiferroic, Ferroelectric, and Functional Materials, Interfaces and Heterostructure, June 2011.
“Investigation of progressive breakdown and non-Weibull failure distribution of high-k and SiO2 dielectric by ramp voltage stress”
Proceedings of the International Reliability Physics Symposium (IRPS), 2011, April (2nd Quarter/Spring) 2011.
“Dielectric Properties of BST/(Y2O3)x(ZrO2)1-x/BST Trilayer Films”
MRS Fall Meeting, Symposium K – Oxide Nanoelectronics, Nov 29-Dec 3, 2010, Boston, MA, January (1st Quarter/Winter) 2011.
“Field Dependent Electrical Conduction in TiN/HfO2/SiO2/P-Si (nMOS) Capacitor for Before and After Stressing”
ECS Transactions, October (4th Quarter/Autumn) 2010.
“Correlation of Negative Bias Temperature Instability and Breakdown in HfO2/TiN Gate Stacks, ”
ECS Transactions: The Electrochemical Society, May 2010.
“Vending Machine Controller Design using VHDL,” Proceedings of the National Conference on Virtual and Intelligent Instrumentation ”
NCVII, BITS, Pilani, India, November 2009.
“Impact of Voltage and Current Stress on TiN/HfO2/TiN MIM Capacitors”
ECS Transactions: The Electrochemical Society, October (4th Quarter/Autumn) 2009.
2018.
“Self-heating effects on Hot carrier degradation and its impact on Ring-Oscillator reliability”
Proceeding of IEEE International Integrated Reliability Workshop, October (4th Quarter/Autumn) 2018.
“Bilayer Dielectrics for RRAM Devices”
ECS Transactions, October (4th Quarter/Autumn) 2018.
“The Multi-Platform Optics and Photonics Educational App”
Proceedings of the ASEE Annual Conference, June 2018.
“Ambient temperature and layout impact on self-heating characterization in FinFET devices”
IEEE International Reliability Physics Symposium (IRPS), March 2018.
“Self-heating measurement methodologies and their assesment on bulk FinFET devices”
Proceeding of IEEE International Integrated Reliability Workshop, October (4th Quarter/Autumn) 2017.
“Breakdown Characteristics of TiN/HfxZr1-xO2/Al2O3/Ge Gate Stacks”
ECS Transactions, October (4th Quarter/Autumn) 2017.
“Solving the Interface Problem in Ge/High-k Gate Stacks”
International Semiconductor Conference for Global Challenge 2017, July (3rd Quarter/Summer) 2017.
“Frequency and Area Dependence of High-K/Ge MOS Capacitors”
ECS Transactions, May 2017.
“Reliability of Post Plasma Oxidation Processed ALD Al2O3/Hf1-xZrxO2 Thin Films on Ge Substrates”
ECS Transactions, May 2017.
“The Effect of Defects on Time Dependent Dielectric Breakdown Acceleration in TiN/ZrO2/Al2O3/p-Ge Gate Stacks”
ECS Transactions, May 2017.
“Reduction of Interface States in Ge/High-k Gate Stacks and Its Reliability Implications”
Proceedings of IEEE International Conference on Solid-State and Integrated Circuit Technology 2016 , October (4th Quarter/Autumn) 2016.
“Bias Temperature Instability and its correlation to flicker (1/f) noise in FinFETs”
Proceeding of IEEE International Integrated Reliability Workshop, October (4th Quarter/Autumn) 2016.
“Dry and Wet Processed Interface Layer in Ge/High-K Devices studied by Deep Level Transient Spectroscopy”
ECS Transactions, May 2016.
“Effect of Post Plasma Oxidation on Ge Gate Stacks Interface Formation”
ECS Transactions, May 2016.
“Improved dislocation model for silicon solar cells: Calculation of dark current”
Conference Record of the IEEE Photovoltaic Specialists Conference, 2015.
“Electrical Characterization of Dry and Wet Processed Interface Layer in Ge/High-K Devices”
ECS Transactions, October (4th Quarter/Autumn) 2015.
“Spatial-Sensitive Feature of DLTS and Application in CdS/CdTe Solar Cells”
31st European Photovoltaic Solar Energy Conference and Exhibition, September 2015.
“Dielectric-Semiconductor Interface for High-k Gate Dielectrics for sub-16nm CMOS Technology ”
Proceedings of IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 2015. , June 2015.
“Oxide structure-dependent interfacial layer defects of HfAlO/SiO2/Si stack analyzed by conductance method”
ECS Transactions, The Electrochemical Society, May 2015.
“Reliability of HfAlOx in Multi Layered Gate Stack”
IEEE International Reliability Physics Symposium 2015, April (2nd Quarter/Spring) 2015.
“High-k Gate Dielectrics For Sub-16nm CMOS Technology: Creating A Perfect Dielectric-Semiconductor Interface”
Proceedings of the IKAUST NSF Research Conference On Electronic Materials, Devices And Systems For A Sustainable Future 2015, February 2015.
“Effect of Al Doping on the Reliability of ALD HfO2”
ECS Transactions, October (4th Quarter/Autumn) 2014.
“Reliability Considerations of High- Dielectrics Deposited by Various Intermediate Treatment”
ECS Transactions, The Electrochemical Society, March 2014.
“Reliability of ALD Hf1-xZrxO2 Deposited by Intermediate Annealing or Intermediate Plasma Treatment”
ECS Transactions, The Electrochemical Society, October (4th Quarter/Autumn) 2013.
“(DS&T Thomas D. Callinan Award Presentation) Role of Hydrogen in Dielectrics for Electronics and Optoelectronics Devices”
ECS Transactions, The Electrochemical Society, May 2013.
“(Electronics & Photonics Division Award Presentation) Si-SiO2 Interface to High-K-Ge/III-V Interface: Passivation and Reliability”
ECS Transactions, The Electrochemical Society, May 2013.
“A 256-channel (element) correlator design based on an FPGA for X-ray Photon Correlation Spectroscopy”
IEEE Nuclear Science Symposium and Medical Imaging Conference, 2012.
“Interface Engineering of High-K and High-Mobility Substrate Interface ”
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), October (4th Quarter/Autumn) 2012.
“Investigation of defects in N+-CDS/P-CdTe solar cells”
38th IEEE Photovoltaic Specialists Conference (PVSC), June 2012.
“A Compact CMOS 3-D Magnetic Field Sensor”
ECS Transactions, The Electrochemical Society, May 2012.
“Relaxor behavior in Ba0.8Sr0.2TiO3/ZrO2 heterostructured thin films”
Mater. Res. Soc. Proc. 1454, DOI: 10.1557/opl. 2012.1254, April (2nd Quarter/Spring) 2012.
“Interfacial layer growth condition dependent electrical conduction in HfO2/SiO2 heterostructured thin films”
Mater. Res. Soc. Proc. 1397, DOI: 10.1557/opl, March 2012.
“Advancements in PV multicrystalline silicon solar cells from 1980 to 2010 - An overview”
Conference Record of the IEEE Photovoltaic Specialists Conference, 2011.
“Impact of Constant Voltage Stress on High-κ Gate Dielectric for RF IC Performance”
ECS Transactions, The Electrochemical Society, October (4th Quarter/Autumn) 2011.
“Investigation of Electrically Active Defects in n-CdS/p-CdTe Solar Cells”
ECS Transactions, The Electrochemical Society, October (4th Quarter/Autumn) 2011.
“Issues and Challenges of High-k Dielectrics on High-Mobility Substrates”
ECS Transactions, The Electrochemical Society, October (4th Quarter/Autumn) 2011.
“ZrO2 layer thickness dependent Electrical and dielectric properties of BST/ZrO2/BST multilayer thin films”
Mater. Res. Soc. Proceedings, WW – Multiferroic, Ferroelectric, and Functional Materials, Interfaces and Heterostructure, June 2011.
“Investigation of progressive breakdown and non-Weibull failure distribution of high-k and SiO2 dielectric by ramp voltage stress”
Proceedings of the International Reliability Physics Symposium (IRPS), 2011, April (2nd Quarter/Spring) 2011.
“Dielectric Properties of BST/(Y2O3)x(ZrO2)1-x/BST Trilayer Films”
MRS Fall Meeting, Symposium K – Oxide Nanoelectronics, Nov 29-Dec 3, 2010, Boston, MA, January (1st Quarter/Winter) 2011.
“Field Dependent Electrical Conduction in TiN/HfO2/SiO2/P-Si (nMOS) Capacitor for Before and After Stressing”
ECS Transactions, October (4th Quarter/Autumn) 2010.
“Correlation of Negative Bias Temperature Instability and Breakdown in HfO2/TiN Gate Stacks, ”
ECS Transactions: The Electrochemical Society, May 2010.
“Vending Machine Controller Design using VHDL,” Proceedings of the National Conference on Virtual and Intelligent Instrumentation ”
NCVII, BITS, Pilani, India, November 2009.
“Impact of Voltage and Current Stress on TiN/HfO2/TiN MIM Capacitors”
ECS Transactions: The Electrochemical Society, October (4th Quarter/Autumn) 2009.
COLLAPSE
Journal Article
Durgamadhab Misra, P. Zhao, Dina H. Triyoso, V. Kaushik, K. Tapily, R. D. Clark, S. Consiglio, T. Hakamata, C. S. Wajda, G. J. Leusink. 2020. “Dielectrics and Metal Stack Engineering for Multilevel Resistive Random-Access Memory.” ECS Journal of Solid State Science and Technology, vol. 9, no. 053004, pp. 7.
P. Paliwoda, Z. Chbili, A. Kerber, T. Nigam, K. Nagahiro, S. Cimino, M. P. Toledano-Luque, L. Pantisano, B. W. Min, Durgamadhab Misra. 2019. “Self-heating effects on Hot carrier degradation and its impact on logic circuit reliability.” IEEE Transactions on Device and Materials Reliability, vol. 19, no. 2, pp. 249-254.
Bharath Babu Nunna, Debdyuti Mandal, Joo Un Lee, Harsimranjit Singh, Shiqiang Zhuang, Durgamadhab Misra, Md Nasir Uddin Bhuyian, Eon Soo Lee. 2019. “Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfluidic biosensor.” Nano convergence, vol. 6, no. 1, pp. 3.
B. B. Nunna, D. Mandal, J. U. Lee, H. Singh, S. Zhuang, Durgamadhab Misra, M. N. Bhuyian, Eon Soo Lee. 2019. “Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfuidic biosensor.” Nano Convergence, vol. 6:3, pp. 1-12.
P. Paliwoda, P. P. Manik, D. Singh, Z. Chbili, A. Kerber, J. Johnson, Durgamadhab Misra. 2018. “Self-Heating Assessment on Bulk FinFET Devices Through Characterization and Predictive Simulation.” IEEE Transactions on Device and Materials Reliability, vol. 18, no. 2, pp. 133-138.
P. Paliwoda, Z. Chbili, A. Kerber, T. Nigam, K. Nagahiro, S. Cimino, M. P. Toledano-Luque, L. Pantisano, B. W. Min, Durgamadhab Misra. 2019. “Self-heating effects on Hot carrier degradation and its impact on logic circuit reliability.” IEEE Transactions on Device and Materials Reliability, vol. 19, no. 2, pp. 249-254.
Bharath Babu Nunna, Debdyuti Mandal, Joo Un Lee, Harsimranjit Singh, Shiqiang Zhuang, Durgamadhab Misra, Md Nasir Uddin Bhuyian, Eon Soo Lee. 2019. “Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfluidic biosensor.” Nano convergence, vol. 6, no. 1, pp. 3.
B. B. Nunna, D. Mandal, J. U. Lee, H. Singh, S. Zhuang, Durgamadhab Misra, M. N. Bhuyian, Eon Soo Lee. 2019. “Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfuidic biosensor.” Nano Convergence, vol. 6:3, pp. 1-12.
P. Paliwoda, P. P. Manik, D. Singh, Z. Chbili, A. Kerber, J. Johnson, Durgamadhab Misra. 2018. “Self-Heating Assessment on Bulk FinFET Devices Through Characterization and Predictive Simulation.” IEEE Transactions on Device and Materials Reliability, vol. 18, no. 2, pp. 133-138.
SHOW MORE
M. N. Bhuyian, P. Shao, A. Sengupta, Y. M. Ding, Durgamadhab Misra, K. Tapily, R. D. Clark, S. Consiglio, C. S. Wajda, G. J. Leusink. 2018. “Post Plasma Oxidation Processed ALD Al2O3/Hf1-xZrxO2 Thin Films on Ge Substrates: Reliability.” ECS Journal of Solid State Science and Technology, vol. 7, no. 2, pp. N1-N6.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics.” ACS Omega, vol. 2, no. 9, pp. 5708–5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of phosphor-free III-nitride nanowire light-emitting diodes on metal substrates for flexible photonics.” ACS omega, vol. 2, no. 9, pp. 5708--5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics.” ACS Omega, vol. 2, no. 9, pp. 5708--5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics.” ACS Omega, vol. 2, no. 9, pp. 5708--5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of phosphor-free III-nitride nanowire light-emitting diodes on metal substrates for flexible photonics.” ACS omega, vol. 2, no. 9, pp. 5708--5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of phosphor-free III-nitride nanowire light-emitting diodes on metal substrates for flexible photonics.” ACS omega, vol. 2, no. 9, pp. 5708--5714.
M. R. Philip, D. D. Choudhary, M. Djavid, M. N. Bhuyian, T. H.Q. Bui, Durgamadhab Misra, Abdallah Khreishah, J. S. Piao, H. D. Nguyen, K. Q. Le, Hieu Pham Trung Nguyen. 2017. “Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics.” ACS Omega, vol. 2, no. 9, pp. 5708-5714.
R Yuan, P A Taylor, Tara L. Alvarez, Durgamadhab Misra, Bharat Biswal. 2017. “MAPBOT: Meta-analytic parcellation based on text, and its application to the human thalamus..” NeuroImage, vol. 157, pp. 716-732.
R. Yuan, P. A. Taylor, Tara L. Alvarez, Durgamadhab Misra, Bharat Biswal. 2017. “MAPBOT: Meta-analytic parcellation based on text, and its application to the human thalamus.” NeuroImage, vol. 157, pp. 716-732.
Y. M. Ding, Durgamadhab Misra, P. Srinivasan. 2017. “Flicker Noise Performance on Thick and Thin Oxide FinFETs.” IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 64, no. 5, pp. 2321-2325.
Y. M. Ding, Durgamadhab Misra, K. Tapily, R. D. Clark, S. Consiglio, C. S. Wajda, G. J. Leusink. 2017. “Impact of Slot Plane Antenna Annealing on Carrier Transport Mechanism and Reliability on ZrO2/Al2O3/Ge Gate Stack.” IEEE Transactions on Device and Materials Reliability, vol. 17, no. 2, pp. 349-354.
M. R. Philip, D. D. Choudhary, M. Djavid, M. N. Bhuyian, J. S. Piao, T. T. Pham, Durgamadhab Misra, Hieu Pham Trung Nguyen. 2017. “Controlling color emission of InGaN/AlGaN nanowire light-emitting diodes grown by molecular beam epitaxy.” Journal of Vacuum Science & Technology B, vol. 35, no. 2, pp. 02B108-1-5.
Y. M. Ding, Z. Cheng, X. Tan, Durgamadhab Misra, A. E. Delahoy, K. S. Chin. 2016. “Detection of electron emission as DLTS signal in CdTe solar cells.” Journal of Applied Physics, vol. 120, no. 13, pp. 135704-1-8.
M. N. Bhuyian, R. Sengupta, P. Vurikiti, Durgamadhab Misra. 2016. “Oxygen vacancy defect engineering using atomic layer deposited HfAlOx in multi-layered gate stack.” Applied Physics Letters, vol. 108, no. 18, pp. 1-5.
M. N. Bhuyian, Durgamadhab Misra, K. Tapily, R. D. Clark, S. Consiglio, C. S. Wajda, G. J. Leusink. 2016. “Interface state density Engineering in Hf1-xZrxO2/SiON/Si gate stack.” Journal of Vacuum Science & Technology B, vol. 34, no. 1, pp. 7.
M. N. Bhuyian, Durgamadhab Misra. 2015. “ALD Hf0.2Zr0.8O2 and HfO2 with Cyclic Annealing/SPA Plasma Treatment: Reliability.” Emerging Materials Research (journal), vol. 4, no. 2, pp. 229-238.
M. N. Bhuyian, S. Poddar, Durgamadhab Misra, K. Tapily, R. D. Clark, S. Consiglio, C. S. Wajda, G. Nakamura, G. J. Leusink. 2015. “Impact of cyclic plasma treatment on oxygen vacancy defects in TiN/HfZrO/SiON/Si gate stacks.” Applied Physics Letters, vol. 106, no. 19.
M. N. Bhuyian, Durgamadhab Misra. 2015. “Multilayered ALD HfAlOx and HfO2 for High-Quality Gate Stacks.” IEEE Transactions on Device and Materials Reliability, vol. 15, no. 2, pp. 229-235.
Y. M. Ding, Durgamadhab Misra. 2015. “Oxide structure-dependent interfacial layer defects of HfAlO/SiO2/Si stack analyzed by conductance method.” Journal of Vacuum Science & Technology B, vol. 33, pp. 021203.
M. N. Bhuyian, Durgamadhab Misra, K. Tapily, R. D. Clark, S. Consiglio, C. S. Wajda, G. Nakamura, G. J. Leusink. 2014. “Cyclic Plasma Treatment during ALD Hf1-xZrxO2 Deposition.” ECS Journal of Solid State Science and Technology, vol. 3, no. 5, pp. N83-N88.
Santosh K. Sahoo, Durgamadhab Misra, B. L. Sopori, R. Rivero, N. M. Ravindra. 2013. “Impact of interface trap density at metal/SiNx/n+ MOS capacitor in multilayered Si solar cells.” Emerging Materials Research, vol. 3, no. EMR2, pp. 101-105.
Vinay Budhraja, B. Sopori, N. M. Ravindra, Durgamadhab Misra. 2013. “An Improved Dislocation Model of Silicon Solar Cell.” Progress in Photovoltaics Research & Applications.
P. Kharangarh, Durgamadhab Misra, G. Georgiou, Ken K. Chin. 2013. “Characterization of space charge layer deep defects in n+-CdS/p-CdTe solar cells by temperature dependent capacitance spectroscopy.” Journal of Applied Physics, vol. 113, pp. 114504.
Roger KWADZOGAH, Durgamadhab Misra. 2013. “Simultaneous Identification of Friction and Transfer Function of a DC Servo Positioning System via Simulation.” The International Journal of INTELLIGENT CONTROL AND SYSTEMS , vol. 18, no. 1, pp. 10-16.
Jyothi Kasinath, A.N. Chandorkar, Durgamadhab Misra. 2013. “Voltage and current stress induced variations in TiN/HfSixOy/TiN MIM capacitors.” Microelectronics Reliability, vol. 53, no. 2, pp. 270-273.
Zhi Young Li, G. De Geronimo, D. Peter Siddons, Durgamadhab Misra, Trevor A. Tyson. 2012. “A Switcher ASIC Design for Use in a Charge-Pump Detector.” IEEE Transaction on Nuclear Science, vol. 59, no. 6, pp. 3205-3212.
P. Kharangarh, Durgamadhab Misra, G. Georgiou, Ken K. Chin. 2012. “Evaluation of Cu Back Contact Related Deep Defects in CdTe Solar Cells.” ECS Journal of Solid State Science and Technology, vol. 1, no. 5, pp. Q110-Q113.
S. K. Sahoo, Durgamadhab Misra. 2012. “Interfacial layer growth condition dependent carrier transport mechanisms in HfO2/SiO2 gate stacks.” Applied Physics Letters, vol. 100, pp. 232903.
S. K. Sahoo, Durgamadhab Misra. 2011. “Field dependent electrical conduction in HfO2/SiO2 gate stack for before and after constant voltage stressing.” Journal of Applied Physics, vol. 110, no. 8, pp. 084104.
Vinay Budhraja, Durgamadhab Misra, N. M. Ravindra. 2011. “Simulation of Device Parameters of High Efficiency Multicrystalline Silicon Solar Cells.” Emerging Materials Research, vol. 1, no. 1, pp. 25-32.
Santosh K. Sahoo, Durgamadhab Misra, M. Sahoo, C. A. MacDonald, H. Bakhru, D. C. Agrawal, Y. N. Mohapatra, S. B. Majumder, R. S. Katiyar. 2011. “Improved dielectric properties and their temperature insensitivity in multilayered Ba0.8Sr0.2TiO3/ZrO2 thin films.” Journal of Applied Physics, vol. 109, no. 064108, pp. 6 pages.
Santosh K. Sahoo, Durgamadhab Misra, D. C. Agrawal, Y. N. Mohapatra, S. B. Majumder, R. S. Katiyar. 2010. “Leakage mechanism of Ba0.8Sr0.2TiO3/ZrO2 multilayer thin films.” Journal of Applied Physics, vol. 108, no. 074112, pp. 5 pages.
V Budhraja, X Wang, Durgamadhab Misra. 2010. “MOS capacitors with metal gate/high-k dielectrics on GaAs bulk substrate.” J Materials Science: Materials in Electronics by Springer, vol. 21, no. 12, pp. 1322-1326.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics.” ACS Omega, vol. 2, no. 9, pp. 5708–5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of phosphor-free III-nitride nanowire light-emitting diodes on metal substrates for flexible photonics.” ACS omega, vol. 2, no. 9, pp. 5708--5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics.” ACS Omega, vol. 2, no. 9, pp. 5708--5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics.” ACS Omega, vol. 2, no. 9, pp. 5708--5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of phosphor-free III-nitride nanowire light-emitting diodes on metal substrates for flexible photonics.” ACS omega, vol. 2, no. 9, pp. 5708--5714.
Moab Rajan Philip, Dipayan Datta Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, Thang Ha Quoc Bui, Durgamadhab Misra, Abdallah Khreishah, James Piao, Hoang Duy Nguyen, Khai Quang Le, others. 2017. “Fabrication of phosphor-free III-nitride nanowire light-emitting diodes on metal substrates for flexible photonics.” ACS omega, vol. 2, no. 9, pp. 5708--5714.
M. R. Philip, D. D. Choudhary, M. Djavid, M. N. Bhuyian, T. H.Q. Bui, Durgamadhab Misra, Abdallah Khreishah, J. S. Piao, H. D. Nguyen, K. Q. Le, Hieu Pham Trung Nguyen. 2017. “Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics.” ACS Omega, vol. 2, no. 9, pp. 5708-5714.
R Yuan, P A Taylor, Tara L. Alvarez, Durgamadhab Misra, Bharat Biswal. 2017. “MAPBOT: Meta-analytic parcellation based on text, and its application to the human thalamus..” NeuroImage, vol. 157, pp. 716-732.
R. Yuan, P. A. Taylor, Tara L. Alvarez, Durgamadhab Misra, Bharat Biswal. 2017. “MAPBOT: Meta-analytic parcellation based on text, and its application to the human thalamus.” NeuroImage, vol. 157, pp. 716-732.
Y. M. Ding, Durgamadhab Misra, P. Srinivasan. 2017. “Flicker Noise Performance on Thick and Thin Oxide FinFETs.” IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 64, no. 5, pp. 2321-2325.
Y. M. Ding, Durgamadhab Misra, K. Tapily, R. D. Clark, S. Consiglio, C. S. Wajda, G. J. Leusink. 2017. “Impact of Slot Plane Antenna Annealing on Carrier Transport Mechanism and Reliability on ZrO2/Al2O3/Ge Gate Stack.” IEEE Transactions on Device and Materials Reliability, vol. 17, no. 2, pp. 349-354.
M. R. Philip, D. D. Choudhary, M. Djavid, M. N. Bhuyian, J. S. Piao, T. T. Pham, Durgamadhab Misra, Hieu Pham Trung Nguyen. 2017. “Controlling color emission of InGaN/AlGaN nanowire light-emitting diodes grown by molecular beam epitaxy.” Journal of Vacuum Science & Technology B, vol. 35, no. 2, pp. 02B108-1-5.
Y. M. Ding, Z. Cheng, X. Tan, Durgamadhab Misra, A. E. Delahoy, K. S. Chin. 2016. “Detection of electron emission as DLTS signal in CdTe solar cells.” Journal of Applied Physics, vol. 120, no. 13, pp. 135704-1-8.
M. N. Bhuyian, R. Sengupta, P. Vurikiti, Durgamadhab Misra. 2016. “Oxygen vacancy defect engineering using atomic layer deposited HfAlOx in multi-layered gate stack.” Applied Physics Letters, vol. 108, no. 18, pp. 1-5.
M. N. Bhuyian, Durgamadhab Misra, K. Tapily, R. D. Clark, S. Consiglio, C. S. Wajda, G. J. Leusink. 2016. “Interface state density Engineering in Hf1-xZrxO2/SiON/Si gate stack.” Journal of Vacuum Science & Technology B, vol. 34, no. 1, pp. 7.
M. N. Bhuyian, Durgamadhab Misra. 2015. “ALD Hf0.2Zr0.8O2 and HfO2 with Cyclic Annealing/SPA Plasma Treatment: Reliability.” Emerging Materials Research (journal), vol. 4, no. 2, pp. 229-238.
M. N. Bhuyian, S. Poddar, Durgamadhab Misra, K. Tapily, R. D. Clark, S. Consiglio, C. S. Wajda, G. Nakamura, G. J. Leusink. 2015. “Impact of cyclic plasma treatment on oxygen vacancy defects in TiN/HfZrO/SiON/Si gate stacks.” Applied Physics Letters, vol. 106, no. 19.
M. N. Bhuyian, Durgamadhab Misra. 2015. “Multilayered ALD HfAlOx and HfO2 for High-Quality Gate Stacks.” IEEE Transactions on Device and Materials Reliability, vol. 15, no. 2, pp. 229-235.
Y. M. Ding, Durgamadhab Misra. 2015. “Oxide structure-dependent interfacial layer defects of HfAlO/SiO2/Si stack analyzed by conductance method.” Journal of Vacuum Science & Technology B, vol. 33, pp. 021203.
M. N. Bhuyian, Durgamadhab Misra, K. Tapily, R. D. Clark, S. Consiglio, C. S. Wajda, G. Nakamura, G. J. Leusink. 2014. “Cyclic Plasma Treatment during ALD Hf1-xZrxO2 Deposition.” ECS Journal of Solid State Science and Technology, vol. 3, no. 5, pp. N83-N88.
Santosh K. Sahoo, Durgamadhab Misra, B. L. Sopori, R. Rivero, N. M. Ravindra. 2013. “Impact of interface trap density at metal/SiNx/n+ MOS capacitor in multilayered Si solar cells.” Emerging Materials Research, vol. 3, no. EMR2, pp. 101-105.
Vinay Budhraja, B. Sopori, N. M. Ravindra, Durgamadhab Misra. 2013. “An Improved Dislocation Model of Silicon Solar Cell.” Progress in Photovoltaics Research & Applications.
P. Kharangarh, Durgamadhab Misra, G. Georgiou, Ken K. Chin. 2013. “Characterization of space charge layer deep defects in n+-CdS/p-CdTe solar cells by temperature dependent capacitance spectroscopy.” Journal of Applied Physics, vol. 113, pp. 114504.
Roger KWADZOGAH, Durgamadhab Misra. 2013. “Simultaneous Identification of Friction and Transfer Function of a DC Servo Positioning System via Simulation.” The International Journal of INTELLIGENT CONTROL AND SYSTEMS , vol. 18, no. 1, pp. 10-16.
Jyothi Kasinath, A.N. Chandorkar, Durgamadhab Misra. 2013. “Voltage and current stress induced variations in TiN/HfSixOy/TiN MIM capacitors.” Microelectronics Reliability, vol. 53, no. 2, pp. 270-273.
Zhi Young Li, G. De Geronimo, D. Peter Siddons, Durgamadhab Misra, Trevor A. Tyson. 2012. “A Switcher ASIC Design for Use in a Charge-Pump Detector.” IEEE Transaction on Nuclear Science, vol. 59, no. 6, pp. 3205-3212.
P. Kharangarh, Durgamadhab Misra, G. Georgiou, Ken K. Chin. 2012. “Evaluation of Cu Back Contact Related Deep Defects in CdTe Solar Cells.” ECS Journal of Solid State Science and Technology, vol. 1, no. 5, pp. Q110-Q113.
S. K. Sahoo, Durgamadhab Misra. 2012. “Interfacial layer growth condition dependent carrier transport mechanisms in HfO2/SiO2 gate stacks.” Applied Physics Letters, vol. 100, pp. 232903.
S. K. Sahoo, Durgamadhab Misra. 2011. “Field dependent electrical conduction in HfO2/SiO2 gate stack for before and after constant voltage stressing.” Journal of Applied Physics, vol. 110, no. 8, pp. 084104.
Vinay Budhraja, Durgamadhab Misra, N. M. Ravindra. 2011. “Simulation of Device Parameters of High Efficiency Multicrystalline Silicon Solar Cells.” Emerging Materials Research, vol. 1, no. 1, pp. 25-32.
Santosh K. Sahoo, Durgamadhab Misra, M. Sahoo, C. A. MacDonald, H. Bakhru, D. C. Agrawal, Y. N. Mohapatra, S. B. Majumder, R. S. Katiyar. 2011. “Improved dielectric properties and their temperature insensitivity in multilayered Ba0.8Sr0.2TiO3/ZrO2 thin films.” Journal of Applied Physics, vol. 109, no. 064108, pp. 6 pages.
Santosh K. Sahoo, Durgamadhab Misra, D. C. Agrawal, Y. N. Mohapatra, S. B. Majumder, R. S. Katiyar. 2010. “Leakage mechanism of Ba0.8Sr0.2TiO3/ZrO2 multilayer thin films.” Journal of Applied Physics, vol. 108, no. 074112, pp. 5 pages.
V Budhraja, X Wang, Durgamadhab Misra. 2010. “MOS capacitors with metal gate/high-k dielectrics on GaAs bulk substrate.” J Materials Science: Materials in Electronics by Springer, vol. 21, no. 12, pp. 1322-1326.
COLLAPSE
Chapter
Yiming Ding, Yiming Bhuyian, Yiming Ding, K.L. Ganapathi, Navakanta Bhat. 2020. “Emerging high-k dielectrics for nanometer CMOS technologies and memory devices.” In Ashok Srivastava and Saraju Mohanty (Eds.), High-k Gate Dielectrics pp. 159-196. Stevenage Herts, SG1 2AY, United Kingdom: The Institution of Engineering and Technology, 2020.
M. N. Bhuyian, Durgamadhab Misra. 2016. “High-k Dielectrics and Device Reliability.” In S. P. Mohanty and A. Srivastava (Eds.), The Institute of Engineering and Technology (IET), UK: Nano-CMOS and Post-CMOS Electronics: Devices and Modelling, 2016.
M. N. Bhuyian, Durgamadhab Misra. 2016. “High-k Dielectrics and Device Reliability.” In S. P. Mohanty and A. Srivastava (Eds.), The Institute of Engineering and Technology (IET), UK: Nano-CMOS and Post-CMOS Electronics: Devices and Modelling, 2016.
Magazine/Trade Publication
“High Dielectric Constant Materials for Nanoscale Devices and Beyond”
Interface, December 2017.
“Importance of Dielectric Science in Today's Technology”
Interface, December 2017.
“Educational Initiatives in the Field of Dielectric and Semiconductor Materials, Devices, and Processing”
Interface, The Electrochemical Society, April (2nd Quarter/Spring) 2012.
“Evolution of Dielectric Science and Technology for Nanoelectronics”
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012.
“High-k Dielectrics on High-Mobility Substrates”
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012.
Interface, December 2017.
“Importance of Dielectric Science in Today's Technology”
Interface, December 2017.
“Educational Initiatives in the Field of Dielectric and Semiconductor Materials, Devices, and Processing”
Interface, The Electrochemical Society, April (2nd Quarter/Spring) 2012.
“Evolution of Dielectric Science and Technology for Nanoelectronics”
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012.
“High-k Dielectrics on High-Mobility Substrates”
Interface, The Electrochemical Society, January (1st Quarter/Winter) 2012.
Conference Abstract
“Breakdown Characteristics of TiN/HfxZr1-xO2/Al2O3/Ge Gate Stacks”
232nd ECS Meeting: Symposium: D01: Semiconductors, Dielectrics, and Metals for Nanoelectronics 15: In Memory of Samares Kar, October (4th Quarter/Autumn) 2017.
232nd ECS Meeting: Symposium: D01: Semiconductors, Dielectrics, and Metals for Nanoelectronics 15: In Memory of Samares Kar, October (4th Quarter/Autumn) 2017.
Other
“A Compact CMOS 3-D Magnetic Field Sensor”
221st Meeting of The Electrochemical Society, Seattle, Washington, May 6 - May 10, 2012 , May 2012.
“Interfacial layer growth condition dependent carrier transport mechanisms in HfO2/SiO2 gate stacks”
MRS Fall Meeting, Boston, MA, November 28-December 2, 2011, November 2011.
“Impact of Constant Voltage Stress on High-κ Gate Dielectric for RF IC Performance”
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011.
“Investigation of Electrically Active Defects in n-CdS/p-CdTe Solar Cells”
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011.
“Issues and Challenges of High-k Dielectrics on High-Mobility Substrates”
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011.
“An Improved Dislocation Model of Silicon Solar Cell”
Photovoltaic Materials and Manufacturing Issues II, Denver, Colorado, Oct 4-7, 2011., October (4th Quarter/Autumn) 2011.
221st Meeting of The Electrochemical Society, Seattle, Washington, May 6 - May 10, 2012 , May 2012.
“Interfacial layer growth condition dependent carrier transport mechanisms in HfO2/SiO2 gate stacks”
MRS Fall Meeting, Boston, MA, November 28-December 2, 2011, November 2011.
“Impact of Constant Voltage Stress on High-κ Gate Dielectric for RF IC Performance”
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011.
“Investigation of Electrically Active Defects in n-CdS/p-CdTe Solar Cells”
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011.
“Issues and Challenges of High-k Dielectrics on High-Mobility Substrates”
220th ECS Meeting, Boston, MA, October 9 - October 14, 2011, October (4th Quarter/Autumn) 2011.
“An Improved Dislocation Model of Silicon Solar Cell”
Photovoltaic Materials and Manufacturing Issues II, Denver, Colorado, Oct 4-7, 2011., October (4th Quarter/Autumn) 2011.